Browsing by Author Ahmad, I.B.

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Issue DateTitleAuthor(s)
2008Effect of treated silver nanoparticles to electrical conductivity improvement of electrically conductive adhesive (ECA)Kornain, Z. ; Amin, N. ; Jalar, A. ; Cheah, A.Y. ; Ahmad, I. 
2006Effect of wafer thinning methods towards fracture strength and topography of silicon dieJiun, H.H. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2011Effects of different catalytic activation techniques on the thermal performance of flip chip heat spreaderLim, V. ; Amin, N. ; Foong, C.S. ; Ahmad, I. ; Zaharim, A. ; Rasid, R. ; Jalar, A. 
2014Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS deviceAtan, N.B. ; Ahmad, I.B. ; Majlis, B.B.Y. 
2000Electrical and microstructures properties of polygate electrode in 0.5 μm CMOS devicesOmar, A. ; Ahmad, I. ; Alias, A.J. 
2003Electrical testing for MEMS's piezoresistive pressure sensorAbd Wahab, M.Z.B. ; Sauli, Z.B. ; Ahmad, I. ; Suradi, W.B. 
2007Evaluation of different die attach film and epoxy pastes for stacked die QFN packageAhmad, I. ; Bachok, N.N. ; Chiang, N.C. ; Talib, M.Z.M. ; Rosle, M.F. ; Latip, F.L.A. ; Aziz, Z.A. 
2006Fabrication of platinum membrane on silicon for MEMS microphoneHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2008FCPBGA with SOP pad finishing a study of lead-free solder ball attach improvementLeng, E.P. ; Ling, W.T. ; Amin, N. ; Ahmad, I. 
2006Formation of thick spin-on glass (SOG) sacrificial layer for capacitive accelerometer encapsulationHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2007HF etching of sacrificial spin-on glass in straight and junctioned microchannels for MEMS microstructure releaseHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2012High performance of a SOI-based lateral PIN photodiode using SiGe/Si multilayer quantum wellMenon, P.S. ; Tasirin, S.K. ; Ahmad, I. ; Abdullah, S.F. 
2013High performance silicon lateral PIN photodiodeTasirin, S.K. ; Menon, P.S. ; Ahmad, I. ; Abdullah, S.F. 
2018High-k Dielectric Thickness and Halo Implant on Threshold Voltage ControlMah, S.K. ; Ahmad, I. ; Ker, P.J. ; Noor Faizah, Z.A. 
2012Impact of different dose and angle in HALO structure for 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2010Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2006Impact of low-k devices on failure mode of flip chip tensile pull testEndut, Z. ; Ahmad, I. ; Swee, G.L.H. ; Sukemi, N.M. 
2008Improved series resistance model for CMOS ESD diodesKamal, N.B. ; Kordesch, A.V. ; Ahmad, I.B. 
2011Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2019Influence of optimization of control factors on threshold voltage of 18 nm HfO2/TiSi2 NMOSAtan, N.B. ; Majlis, B.B.Y. ; Ahmad, I.B. ; Chong, K.H.