Showing results 6 to 25 of 28
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Issue Date | Title | Author(s) |
2006 | Effect of moisture on underfill interfacial adhesion and packages flexural strength in flip chip packaging | Endut, Z. ; Ahmad, I. ; Zaharim, A. ; Sukemi, N.M. |
2010 | Effect of process parameter variations on threshold voltage in 45nm NMOS device | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. |
2011 | Effects of different catalytic activation techniques on the thermal performance of flip chip heat spreader | Lim, V. ; Amin, N. ; Foong, C.S. ; Ahmad, I. ; Zaharim, A. ; Rasid, R. ; Jalar, A. |
2011 | Employability skills for an entry-level engineer as seen by Malaysian employers | Yuzainee, M.Y. ; Zaharim, A. ; Omar, M.Z. |
2009 | Employability skills framework for engineering graduate in Malaysia | Zaharim, A. ; Yusoff, Y.M.D. ; Omar, M.Z. ; Basri, H. |
2012 | Employability skills performance score for fresh engineering graduates in Malaysian industry | Md Yusoff, Y. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. |
2009 | Employers' selection skills in recruiting fresh engineering graduates | Md Yusoff, Y. ; Zaharim, A. ; Omar, M.Z. ; Mohamed, A. ; Muhamad, N. ; Mustafa, R. |
2013 | Employment preference for university of fresh engineering graduates | Yuzainee, M.Y. ; Rahmat, R.A.O.K. ; Zaharim, A. |
2010 | Enhancing employability skills through industrial training programme | Yusoff, Y.M. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. ; Mustapha, R. |
2012 | Impact of different dose and angle in HALO structure for 45nm NMOS device | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. |
2010 | Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS device | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. |
2011 | Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS device | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. |
2011 | Optimization of HALO structure effects in 45nm p-type MOSFETs device using taguchi method | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Elgomati, H.A. ; Majlis, B.Y. ; Apte, P.R. |
2011 | Optimization of input process parameters variation on threshold voltage in 45 nm NMOS device | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Hashim, U. ; Apte, P.R. |
2011 | Optimization of process parameter variability in 45 nm PMOS device using Taguchi method | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. |
2012 | Optimization of process parameter variation in 45nm p-channel MOSFET using L18 orthogonal array | Salehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Hamid, A.M.A. ; Menon, P.S. ; Elgomati, H.A. ; Majlis, B.Y. ; Apte, P.R. |
2009 | Optimization of PV-Wind-Hydro-Diesel hybrid system by minimizing excess capacity | Ab. Razak, J. ; Sopian, K. ; Ali, Y. ; Alghoul, M.A. ; Zaharim, A. ; Ahmad, I. |
2011 | Optimizing 35nm NMOS devices V TH and I LEAK by controlling active area and halo implantation dosage | Elgomati, H.A. ; Majlis, B.Y. ; Salehuddin, F. ; Ahmad, I. ; Zaharim, A. ; Hamid, F.A. |
2012 | Performance of engineering graduates as perceived by employers: Past and present | Basri, H. ; Zaharim, A. ; Omar, M.Z. ; Yuzainee, M.Y. |
2006 | Performances test statistics for single outlier detection in bilinear (1,1,1,1) models | Zaharim, A. ; Mohamed, I. ; Ahmad, I. ; Abdullah, S. ; Omar, M.Z. |