Goh, K.H.
Publications
(Articles)
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2017 | Investigation of the effect of anodization time and annealing temperature on the physical properties of ZrO2 thin film on a Si substrate | Goh, K.H. ; Lee, H.J. ; Lau, S.K. ; Teh, P.C. ; Ramesh, S. ; Tan, C.Y. ; Wong, Y.H. |
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Full Name
Goh, K.H.
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