Atan, N.B.
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2015 | Influence of process parameters on threshold voltage and leakage current in 18nm NMOS device | Atan, N.B. ; Ahmad, I.B. ; Majlis, B.B.Y. ; Fauzi, I.B.A. |
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Atan, N.B.
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