Please use this identifier to cite or link to this item: http://dspace.uniten.edu.my/jspui/handle/123456789/5699
DC FieldValueLanguage
dc.contributor.authorRaymond, W.J.K.en_US
dc.contributor.authorChakrabarty, C.K.en_US
dc.contributor.authorHock, G.C.en_US
dc.contributor.authorGhani, A.B.en_US
dc.date.accessioned2017-12-08T06:45:30Z-
dc.date.available2017-12-08T06:45:30Z-
dc.date.issued2013-
dc.description.abstractComplex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%. © 2013 Published by Elsevier Ltd.en_US
dc.language.isoen_USen_US
dc.relation.ispartofMeasurement: Journal of the International Measurement Confederation Volume 46, Issue 10, 2013, Pages 3796-3801en_US
dc.titleComplex permittivity measurement using capacitance method from 300 kHz to 50 MHzen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.measurement.2013.06.039-
item.fulltextNo Fulltext-
item.grantfulltextnone-
Appears in Collections:COE Scholarly Publication
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.