Please use this identifier to cite or link to this item: http://dspace.uniten.edu.my/jspui/handle/123456789/5833
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dc.contributor.authorYap, B.K.en_US
dc.contributor.authorKoh, S.P.en_US
dc.contributor.authorTiong, S.K.en_US
dc.contributor.authorOng, C.N.en_US
dc.date.accessioned2017-12-08T07:26:34Z-
dc.date.available2017-12-08T07:26:34Z-
dc.date.issued2010-
dc.description.abstractThis work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from the light-emitting polymer in the PLED suggesting that the layer of light-emitting polymer is intact. However, the rapid degradation of the electrical performance of the PLED right after the first cycle of thermal stress test suggests that the electrodes have degraded hence hindering charge injection into the polymeric layer. © 2010 IEEE.en_US
dc.language.isoen_USen_US
dc.relation.ispartofIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 2010, Article number 5549354, Pages 370-372en_US
dc.titleThermal stress test for PLEDen_US
dc.typeConference Paperen_US
dc.identifier.doi10.1109/SMELEC.2010.5549354-
item.fulltextNo Fulltext-
item.grantfulltextnone-
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