Please use this identifier to cite or link to this item: http://dspace.uniten.edu.my/jspui/handle/123456789/8810
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dc.contributor.authorYap, B.K.
dc.contributor.authorKoh, S.P.
dc.contributor.authorTiong, S.K.
dc.contributor.authorOng, C.N.
dc.date.accessioned2018-02-21T04:29:38Z-
dc.date.available2018-02-21T04:29:38Z-
dc.date.issued2010
dc.identifier.urihttp://dspace.uniten.edu.my/jspui/handle/123456789/8810-
dc.description.abstractThis work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from the light-emitting polymer in the PLED suggesting that the layer of light-emitting polymer is intact. However, the rapid degradation of the electrical performance of the PLED right after the first cycle of thermal stress test suggests that the electrodes have degraded hence hindering charge injection into the polymeric layer. © 2010 IEEE.
dc.titleThermal stress test for PLED
item.fulltextNo Fulltext-
item.grantfulltextnone-
Appears in Collections:COE Scholarly Publication
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