Browsing by Author Omar, G.

Showing results 1 to 12 of 12
Issue DateTitleAuthor(s)
2004Alternative double pass dicing method for thin wafer laminated with die attach filmJiun, H.H. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2006Effect of laminated wafer toward dicing process and alternative double pass sawing method to reduce chippingJiun, H.H. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2006Effect of wafer thinning methods towards fracture strength and topography of silicon dieJiun, H.H. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2008Intermetallic growth of Sn-Ag-Sb/Ni plated Cu in power packaging subject to thermal agingShualdi, W. ; Ahmad, I. ; Omar, G. ; Isnin, A. 
2005Microstructure study of lead free solders in electroless nickel gold under bump metallurgy solder bumpSalleh, M.M. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2011Nanoindentation characterization of Sn-Ag-Sb/Cu substrate IMC Layer subject to thermal agingShualdi, W. ; Bais, B. ; Ahmad, I. ; Omar, G. ; Isnin, A. 
2004Some aspects of surface morphology and elemental analysis study on non-wetting problem at die topSalleh, M.M. ; Ahmad, I. ; Jalar, A. ; Omar, G. ; Abdullah, S.H. ; Arshad, M.K. 
2004Temperature & zincation process effect on electrical resistivity of aluminum bond pad for under Bump Metallurgy (UBM)Kornain, Z. ; Ahmad, I. ; Omar, G. 
2007The characterization of Al bond pad surface treatment in electroless nickel immersion gold (ENIG) depositionMd Arshad, M.K. ; Jalar, A. ; Ahmad, I. ; Omar, G. 
2006The effects of multiple zincation process on aluminum bond pad surface for electroless nickel immersion gold depositionMd Arshad, M.K. ; Ahmad, I. ; Jalar, A. ; Omar, G. ; Hashim, U. 
2004The effects of zincation process on aluminum bond pad surfaces for Electroless Nickel Immersion Gold (ENIG) depositionMd Arshad, M.K. ; Ahmad, I. ; Jalar, A. ; Omar, G. 
2006The surface characteristics of under bump metallurgy (UBM) in electroless nickel immersion gold (ENIG) depositionArshad, M.K.M. ; Ahmad, I. ; Jalar, A. ; Omar, G.