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Browsing by Author Sayed, N.M.
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| Issue Date | Title | Author(s) |
|---|---|---|
| 2018 | Threshold voltage and leakage current variability on process parameter in a 22nm PMOS Device | Afifah Maheran, A.H. ; Menon, P.S. ; Ahmad, I. ; Noor Faizah, Z.A. ; Mohd Zain, A.S. ; Salehuddin, F. ; Sayed, N.M. |