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Issue Date	Title	Author(s)
2012	Scaling down of the 32 nm to 22 nm gate length NMOS transistor	Afifah Maheran, A.H. ; Menon, P.S. ; Ahmad, I. ; Elgomati, H.A. ; Majlis, B.Y. ; Salehuddin, F.
2011	Statistical optimization for process parameters to reduce variability of 32 nm PMOS transistor threshold voltage	Elgomati, H.A. ; Majlis, B.Y. ; Ahmad, I. ; Salehuddin, F. ; Hamid, F.A. ; Zaharim, A. ; Mohamad, T.Z. ; Apte, P.R.

Showing results 13 to 14 of 14 < previous