Browsing by Author Zaharim, A.


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Issue DateTitleAuthor(s)
2006Effect of moisture on underfill interfacial adhesion and packages flexural strength in flip chip packagingEndut, Z. ; Ahmad, I. ; Zaharim, A. ; Sukemi, N.M. 
2010Effect of process parameter variations on threshold voltage in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Effects of different catalytic activation techniques on the thermal performance of flip chip heat spreaderLim, V. ; Amin, N. ; Foong, C.S. ; Ahmad, I. ; Zaharim, A. ; Rasid, R. ; Jalar, A. 
2011Employability skills for an entry-level engineer as seen by Malaysian employersYuzainee, M.Y. ; Zaharim, A. ; Omar, M.Z. 
2009Employability skills framework for engineering graduate in MalaysiaZaharim, A. ; Yusoff, Y.M.D. ; Omar, M.Z. ; Basri, H. 
2012Employability skills performance score for fresh engineering graduates in Malaysian industryMd Yusoff, Y. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. 
2009Employers' selection skills in recruiting fresh engineering graduatesMd Yusoff, Y. ; Zaharim, A. ; Omar, M.Z. ; Mohamed, A. ; Muhamad, N. ; Mustafa, R. 
2013Employment preference for university of fresh engineering graduatesYuzainee, M.Y. ; Rahmat, R.A.O.K. ; Zaharim, A. 
2010Enhancing employability skills through industrial training programmeYusoff, Y.M. ; Omar, M.Z. ; Zaharim, A. ; Mohamed, A. ; Muhamad, N. ; Mustapha, R. 
2012Impact of different dose and angle in HALO structure for 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2010Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2011Optimization of HALO structure effects in 45nm p-type MOSFETs device using taguchi methodSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Elgomati, H.A. ; Majlis, B.Y. ; Apte, P.R. 
2011Optimization of input process parameters variation on threshold voltage in 45 nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Hashim, U. ; Apte, P.R. 
2011Optimization of process parameter variability in 45 nm PMOS device using Taguchi methodSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2012Optimization of process parameter variation in 45nm p-channel MOSFET using L18 orthogonal arraySalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. ; Hamid, A.M.A. ; Menon, P.S. ; Elgomati, H.A. ; Majlis, B.Y. ; Apte, P.R. 
2009Optimization of PV-Wind-Hydro-Diesel hybrid system by minimizing excess capacityAb. Razak, J. ; Sopian, K. ; Ali, Y. ; Alghoul, M.A. ; Zaharim, A. ; Ahmad, I. 
2011Optimizing 35nm NMOS devices V TH and I LEAK by controlling active area and halo implantation dosageElgomati, H.A. ; Majlis, B.Y. ; Salehuddin, F. ; Ahmad, I. ; Zaharim, A. ; Hamid, F.A. 
2012Performance of engineering graduates as perceived by employers: Past and presentBasri, H. ; Zaharim, A. ; Omar, M.Z. ; Yuzainee, M.Y. 
2006Performances test statistics for single outlier detection in bilinear (1,1,1,1) modelsZaharim, A. ; Mohamed, I. ; Ahmad, I. ; Abdullah, S. ; Omar, M.Z.