Showing results 2156 to 2175 of 15609
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| Issue Date | Title | Author(s) |
| 2016 | Choice of colour space in illuminance measurement with a low-cost digital camera | Tay, L.C. ; Ong, H.S. |
| Apr-2005 | Circuit analysis 1- EEEB 113 & EEB 214 - Semester 1, 2004/2005 | College of Engineering |
| Oct-2003 | Circuit analysis 1- EEEB 214 - Semester 1, 2003/2004 | College of Engineering |
| Oct-2002 | Circuit analysis 1- EEEB 214, Semester 1, 2002/2003 | College of Engineering |
| Feb-2015 | Circuit analysis I - EEEB 113 - Semester 2, 2014/2015 | College of Engineering |
| 2012 | Circuit analysis I - EEEB 113 - Semester 3, 2011/2012 | College of Engineering |
| Nov-2008 | Circuit analysis I - EEEB 113 - Semester 1, 2008/2009 | Collage of Engineering |
| 2009 | Circuit analysis I - EEEB 113 - Semester 1, 2009/2010 | College of Engineering |
| Oct-2010 | Circuit analysis I - EEEB 113 - Semester 1, 2010/2011 | College of Engineering |
| 2011 | Circuit analysis I - EEEB 113 - Semester 1, 2011/2012 | College of Engineering |
| Sep-2012 | Circuit analysis I - EEEB 113 - Semester 1, 2012/2013 | College of Engineering |
| Sep-2013 | Circuit analysis I - EEEB 113 - Semester 1, 2013/2014 | College of Engineering |
| Sep-2014 | Circuit analysis I - EEEB 113 - Semester 1, 2014/2015 | College of Engineering |
| Sep-2015 | Circuit analysis I - EEEB 113 - Semester 1, 2015/2016 | College of Engineering |
| Sep-2016 | Circuit analysis I - EEEB 113 - Semester 1, 2016/2017 | College of Engineering |
| Sep-2017 | Circuit analysis I - EEEB 113 - Semester 1, 2017/2018 | College of Engineering |
| Mar-2008 | Circuit analysis I - EEEB 113 - Semester 2, 2007/2008 | College of Engineering |
| Mar-2009 | Circuit analysis I - EEEB 113 - Semester 2, 2008/2009 | College of Engineering |
| 2012 | Circuit analysis I - EEEB 113 - Semester 2, 2011/2012 | College of Engineering |
| Jan-2013 | Circuit analysis I - EEEB 113 - Semester 2, 2012/2013 | College of Engineering |
