1. DSpaceCRIS@UNITEN
  2. College of Engineering
  3. COE Scholarly Publication
Please use this identifier to cite or link to this item: http://dspace.uniten.edu.my/jspui/handle/123456789/8704
DC FieldValueLanguage
dc.contributor.authorMills, B.-
dc.contributor.authorChau, C.F.-
dc.contributor.authorRogers, E.T.F.-
dc.contributor.authorGrant-Jacob, J.-
dc.contributor.authorStebbings, S.L.-
dc.contributor.authorPraeger, M.-
dc.contributor.authorDe Paula, A.M.-
dc.contributor.authorFroud, C.A.-
dc.contributor.authorChapman, R.T.-
dc.contributor.authorButcher, T.J.-
dc.contributor.authorBrocklesby, W.S.-
dc.contributor.authorFrey, J.G.-
dc.date.accessioned2018-02-20T05:45:50Z-
dc.date.available2018-02-20T05:45:50Z-
dc.date.issued2009-
dc.identifier.urihttp://dspace.uniten.edu.my/jspui/handle/123456789/8704-
dc.description.abstractXUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres. © 2009 OSA.-
dc.language.isoen-
dc.titleSimultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation-
dc.typeArticle-
item.grantfulltextnone-
item.fulltextNo Fulltext-
Appears in Collections:COE Scholarly Publication
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