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|Title:||Thermal stress test for PLED||Authors:||Yap, B.K.
|Issue Date:||2010||Journal:||IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 2010, Article number 5549354, Pages 370-372||Abstract:||This work presents thermal stability studies of PLEDs involving the comparison of electrical performance before and after thermal treatment. Two cycles of continuous thermal stress test from room temperature to 100 deg Celsius did not significantly affect the total photoluminescence intensity from the light-emitting polymer in the PLED suggesting that the layer of light-emitting polymer is intact. However, the rapid degradation of the electrical performance of the PLED right after the first cycle of thermal stress test suggests that the electrodes have degraded hence hindering charge injection into the polymeric layer. © 2010 IEEE.||DOI:||10.1109/SMELEC.2010.5549354|
|Appears in Collections:||COE Scholarly Publication|
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