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De Paula, A.M.
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| Issue Date | Title | Author(s) | |
|---|---|---|---|
| 1 | 2009 | Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation | Mills, B. ; Chau, C.F. ; Rogers, E.T.F. ; Grant-Jacob, J. ; Stebbings, S.L. ; Praeger, M. ; De Paula, A.M. ; Froud, C.A. ; Chapman, R.T. ; Butcher, T.J. ; Brocklesby, W.S. ; Frey, J.G. |
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De Paula, A.M.
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