1. DSpaceCRIS@UNITEN
  2. College of Engineering
  3. COE Scholarly Publication
Please use this identifier to cite or link to this item: http://dspace.uniten.edu.my/jspui/handle/123456789/8704
Title: Simultaneous measurement of structure and XUV dielectric constant of nanoscale objects using diffraction of high harmonic radiation
Authors: Mills, B. 
Chau, C.F. 
Rogers, E.T.F. 
Grant-Jacob, J. 
Stebbings, S.L. 
Praeger, M. 
De Paula, A.M. 
Froud, C.A. 
Chapman, R.T. 
Butcher, T.J. 
Brocklesby, W.S. 
Frey, J.G. 
Issue Date: 2009
Abstract: XUV diffraction using radiation generated by high harmonic generation is used simultaneously to determine both the structure and the complex refractive index of a partially ordered array of 196 nm diameter polystyrene spheres. © 2009 OSA.
URI: http://dspace.uniten.edu.my/jspui/handle/123456789/8704
Appears in Collections:COE Scholarly Publication

Show full item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.