Please use this identifier to cite or link to this item:
http://dspace.uniten.edu.my/jspui/handle/123456789/8706
Title: | Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array | Authors: | Mills, B. Chau, C.F. Rogers, E.T.F. Grant-Jacob, J. Stebbings, S.L. Praeger, M. De Paula, A.M. Froud, C.A. Chapman, R.T. Butcher, T.J. Baumberg, J.J. Brocklesby, W.S. Frey, J.G. |
Issue Date: | 2008 | Abstract: | Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm. © 2008 American Institute of Physics. | URI: | http://dspace.uniten.edu.my/jspui/handle/123456789/8706 |
Appears in Collections: | COE Scholarly Publication |
Show full item record
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.