Browsing by Author Ahmad, I.B.


Or, select a letter below to browse by last name
0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 52 to 71 of 145 < previous   next >
Issue DateTitleAuthor(s)
2011Effects of different catalytic activation techniques on the thermal performance of flip chip heat spreaderLim, V. ; Amin, N. ; Foong, C.S. ; Ahmad, I. ; Zaharim, A. ; Rasid, R. ; Jalar, A. 
2014Effects of high-K dielectrics with metal gate for electrical characteristics of 18nm NMOS deviceAtan, N.B. ; Ahmad, I.B. ; Majlis, B.B.Y. 
2000Electrical and microstructures properties of polygate electrode in 0.5 μm CMOS devicesOmar, A. ; Ahmad, I. ; Alias, A.J. 
2003Electrical testing for MEMS's piezoresistive pressure sensorAbd Wahab, M.Z.B. ; Sauli, Z.B. ; Ahmad, I. ; Suradi, W.B. 
2007Evaluation of different die attach film and epoxy pastes for stacked die QFN packageAhmad, I. ; Bachok, N.N. ; Chiang, N.C. ; Talib, M.Z.M. ; Rosle, M.F. ; Latip, F.L.A. ; Aziz, Z.A. 
2006Fabrication of platinum membrane on silicon for MEMS microphoneHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2008FCPBGA with SOP pad finishing a study of lead-free solder ball attach improvementLeng, E.P. ; Ling, W.T. ; Amin, N. ; Ahmad, I. 
2006Formation of thick spin-on glass (SOG) sacrificial layer for capacitive accelerometer encapsulationHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2007HF etching of sacrificial spin-on glass in straight and junctioned microchannels for MEMS microstructure releaseHamzah, A.A. ; Majlis, B.Y. ; Ahmad, I. 
2012High performance of a SOI-based lateral PIN photodiode using SiGe/Si multilayer quantum wellMenon, P.S. ; Tasirin, S.K. ; Ahmad, I. ; Abdullah, S.F. 
2013High performance silicon lateral PIN photodiodeTasirin, S.K. ; Menon, P.S. ; Ahmad, I. ; Abdullah, S.F. 
2018High-k Dielectric Thickness and Halo Implant on Threshold Voltage ControlMah, S.K. ; Ahmad, I. ; Ker, P.J. ; Noor Faizah, Z.A. 
2012Impact of different dose and angle in HALO structure for 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2010Impact of HALO structure on threshold voltage and leakage current in 45nm NMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2006Impact of low-k devices on failure mode of flip chip tensile pull testEndut, Z. ; Ahmad, I. ; Swee, G.L.H. ; Sukemi, N.M. 
2008Improved series resistance model for CMOS ESD diodesKamal, N.B. ; Kordesch, A.V. ; Ahmad, I.B. 
2011Influence of HALO and source/drain implantation on threshold voltage in 45nm PMOS deviceSalehuddin, F. ; Ahmad, I. ; Hamid, F.A. ; Zaharim, A. 
2015Influence of process parameters on threshold voltage and leakage current in 18nm NMOS deviceAtan, N.B. ; Ahmad, I.B. ; Majlis, B.B.Y. ; Fauzi, I.B.A. 
2008Intermetallic growth of Sn-Ag-Sb/Ni plated Cu in power packaging subject to thermal agingShualdi, W. ; Ahmad, I. ; Omar, G. ; Isnin, A. 
2007Investigation of Sn3.5Ag and Sn3.8Ag0.7Cu Pb-free Alloys for BGA application on Ni/Au FinishEu, P.-L. ; Ding, M. ; Ahmad, I.